Examples

See also https://github.com/LiberTEM/LiberTEM-blobfinder/tree/master/examples for a folder with the notebooks.

Strain map of a transistor

This example shows a typical strain map of a transistor with monocrystalline strained silicon.

• Strain map of a transistor
  • Opening files and determining basic parameters
  • Logsum frame
  • Determine base lattice
  • Adjust matching template
  • Refine the lattice
  • Post-processing and visualization

Strain map of polycrystalline materials

LiberTEM allows to segment a scan into regions of interest to process grains with different orientations and lattice parameters separately. This example uses clustering of a feature vector to process a polycrystalline sample in a fully automated fashion.

• Refine lattice parameters on polycrystalline sample
  • Find the zero order peak
  • Generate a feature vector
  • Clustering
  • Determine parameters individually for each cluster
    • Refine lattice parameters within each cluster
  • Assembling the complete result
  • Result visualization

Upsampling refinement

This example shows the usage of upsampling refinement to improve precision on data with small shifts.

• Upsampling-based subpixel refinement
  • Dataset
  • Run blobfinder
    • Without upsampling
    • With upsampling
    • Comparison
    • With upsample == 50