Examples

See also https://github.com/LiberTEM/LiberTEM-blobfinder/tree/master/examples for a folder with the notebooks.

Strain map of a transistor

This example shows a typical strain map of a transistor with monocrystalline strained silicon.

Strain map of polycrystalline materials

LiberTEM allows to segment a scan into regions of interest to process grains with different orientations and lattice parameters separately. This example uses clustering of a feature vector to process a polycrystalline sample in a fully automated fashion.

Upsampling refinement

This example shows the usage of upsampling refinement to improve precision on data with small shifts.